SPring-8: RIKEN Synchrotron Radiation Multibeam X-ray Ptychography: High Resolution Imaging of Samples
RIKEN: Synchrotron Radiation Research Center
The RIKEN Synchrotron Radiation Research Center / Joint Research Group has succeeded in “Demonstration of X-ray Ptychography (XPG) using synchrotron radiation multibeam [1] (multibeam X-ray Ptychography)”.
Research result: field of use
This research has demonstrated that synchrotron radiation can be used with even higher efficiency using synchrotron radiation multibeams.
The sample can be observed in a wider field of view than the conventional method using a single beam.
“Application to wide-field, high-resolution imaging of various samples“.
Conventional: X-ray Ptychography
In conventional X-ray Ptychography (using partially coherent [2] synchrotron radiation), the synchrotron radiation / utilization efficiency is greatly limited.
Poor synchrotron radiation / use efficiency has hindered the performance of X-ray Ptychography.
This time: Synchrotron radiation multibeam X-ray Ptychography
- This time, the joint research group used the large synchrotron radiation facility “SPring-8” [3].
- Simultaneously irradiate the sample with a focused X-ray multi-beam
- using a “multi-slit with multiple apertures and a total reflection focusing mirror”.
- Obtained diffraction intensity patterns from multiple locations.
Execution result: Successful reconstruction of sample image
Performed phase recovery calculation [5] incorporating total variation regularization [4] in the diffraction intensity pattern.
As a result, the sample image was successfully reconstructed.
This method has the advantage that the efficiency of using synchrotron radiation is improved in proportion to the numerical aperture (number of beams).
The study was published in the online version of the US science journal, Optics Express (January 8).
-(Press Release) — SPring-8 Web Site
http://www.spring8.or.jp/ja/news_publications/press_release/2020/200114_2/
TOHOKU UNIVERSITY-
https://www.tohoku.ac.jp/japanese/2020/01/press20200114-03-X.html