Tokyo Institute of Technology: Develop a device that can be non-destructively inspected simply by attaching it to the fingertip – Terahertz inspection chip with carbon nanotube film

By Sensor, precision

Tokyo Institute of Technology: Develop a device that can be non-destructively inspected simply by attaching it to the fingertip – Terahertz inspection chip with carbon nanotube film

Point

Improve performance of terahertz band detector by controlling physical properties of carbon nanotube film

Detector can be worn on fingers, realizing non-destructive inspection such as crack inspection of piping

Easily inspected at any location regardless of the shape of the object

Tokyo Tech News | Tokyo Institute of Technology

— Translated by TokioX’press —

https://www.titech.ac.jp/news/2018/041811.html

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