New product Actinic EUV pattern mask defect inspection system ACTIS “A150”
Lasertech: Expectations for new (EUV) exposure technology: Supplier Achievement Award: SAA
Laser Tech:
Samsung and TSMC become potential ordering sources-new semiconductor inspection equipment
FY2020/1Q Expected order amount increased to 85 billion yen, and stock prices are rising to the high range since listing.
Semiconductor inspection equipment maker / Laser Tech wins Intel Supplier Achievement Award: SAA.
He recalls that his first award (announced in March) has increased his recognition as a supplier.
Lasertec: President Okabayashi
In September last year, we completed the world’s first “new device for inspecting masks used for circuit printing with extreme ultraviolet (EUV) exposure technology”.
For 5G smartphones, etc., it is indispensable in the “manufacturing process of semiconductors where there is intense competition for miniaturization.”
Orders for new equipment:
President Okabayashi, in an interview with Blueberg,
Including US Intel
Samsung Electronics of Korea,
Taiwan Integrated Circuit Manufacturing (TSMC), etc.
Manufacturers adopting EUV technology have explained that they will be “all potential companies.”
“I think they are interested in and are being considered by multiple manufacturers,” he said.
Laser Tech: Business Forecast
In late April, the forecast order value for the current term (June 2020) was revised upward from 70 billion yen to 85 billion yen.
EUV-related demand is strong, and semiconductor-related equipment increased by 15.5 billion yen.
Samsung Electronics:
On May 21, it announced that it has started construction of a state-of-the-art semiconductor manufacturing line using EUV technology.
Macquarie Capital: Damian Ton
“TSMC, which is promoting miniaturization of 3 nanometers, will be the largest ordering source for Lasertec next year,” he predicts.
Samsung also expects to become a big customer in the future.
Bloomberg
https://www.bloomberg.co.jp/news/articles/2020-05-25/QAUDZHT0AFB401
New product Actinic EUV pattern mask defect inspection system ACTIS “A150” announced
https://www.lasertec.co.jp/topics/upload_files/20190912JP.pdf
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