💡AIST: Significantly high speed and large area inspection technology for thin film transistor array inspection

By TFT, AIST, 5 Science

💡AIST: Significantly high speed and large area inspection technology for thin film transistor array inspection

– Nondestructive in-line inspection of drive circuits such as display manufactured by printing method –

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Significantly improved technology for nondestructively collectively inspecting the driving state of a thin film transistor (TFT) array by optical imaging

Display and other information output device TFT and storage capacitor 30,000 elements are inspected within 3 minutes at once

Enable in-line inspection of large area devices manufactured by printing method, contributing to higher quality

The details of this technology will be published in Organic Electronics, European Science Journal on January 15, 2018 (local time).

http://www.aist.go.jp/aist_j/press_release/pr2018/pr20180115/pr20180115.html

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