🍀NEC and AIST Develop Efficient Technology for Discovery of Rare Critical Events
NEC Corporation (NEC) and Japan’s National Institute of Advanced Industrial Science and Technology (AIST) today announced a new efficient search technology for the discovery of rare critical events.
The technology repeats simulations while artificial intelligence (AI) learns the simulation results.
As a result, it efficiently discovers rare critical events that are difficult to discover at the product design stage due to the extremely low probability of their occurrence.
The technology is one of NEC’s lineup of cutting-edge AI technologies “NEC the WISE” (*1).
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